Redefining the Test Equipment Supply Chain: The Open Architecture Revolution Future Fab Intl. Volume 20, January 07, 2006
As the automated test industry begins embracing the open architecture environment, equipment suppliers and their customers will need to evolve equipment development methodologies to fully benefit from the emerging business model.
Jason Katz, Intel Corporation, Don Edenfeld, Intel Corporation

 Open-Architecture ATE vs. Traditional ATE Future Fab Intl. Volume 19, June 28, 2005
Today, the automated test equipment (ATE) industry is facing a technological revolution in which emerging open-architecture test is competing with traditional ATE. It's conceivable that, in the near future, open-architecture ATE systems will eventually replace the traditional ATE systems that currently dominate the test landscape. Open-architecture ATE can offer practical solutions to the challenge of cost-effectively testing systems-onchip, systems-in-package and other complex semiconductor devices. At the same time, it delivers such benefits as reconfigurability, flexibility, scalability and expandability, while accommodating accelerating test requirements, lowering cost of ownership and lengthening testsystem life cycles.
Yuhai Ma, Advantest

 Benefits Of A True ‘Open Architecture Tester’ Model Future Fab Intl. Volume 18, January 12, 2005
Semiconductor manufacturers are driving a new paradigm shift in semiconductor testing! Fed up with trying to efficiently manage test floors filled with a variety of tester models from multiple vendors, semiconductor manufacturers have started an initiative to drive development of an "open architecture tester" model. Although somewhat reluctant, the tester equipment vendors are responding to this user effort.
Paul Roddy, Freescale Semiconductor

 Open Architecture Testers – Year One: Does Reality Match The Vision? Future Fab Intl. Volume 18, January 12, 2005
Intel’s test equipment roadmap is complex and very difficult to manage. We have over 1,000 high-end automatic test equipment (ATE) testers running more than 1,000 products across a worldwide factory and engineering site network. The costs associated with purchasing, support, training, etc., run into multi-billion dollars and represent a significant portion of product test costs. In addition, most of these platforms are five to 10 years old, making the fleet increasingly costly to maintain.
John Johnson, Intel Corporation, Don Edenfeld, Intel Corporation, Jim Neeb, Intel Corporation